The application of SRAM-based field-programmable gate arrays (FPGAs) in mission-critical systems requires error mitigation and recovery techniques to protect them from the errors caused by high-energy radiation, also known as single event upsets (SEUs). JSI has developed a low area-overhead SEU recovery mechanism that can be applied in different self-recoverable architectures. A fault-emulation environment enables the user to inject faults at selected locations of the configuration memory and experimentally evaluate the reliability of the developed solutions.